Add two new states to enum test_state and use it for flashchips

The new enum test_state looks like this:
enum test_state {
	OK = 0,
	NT = 1,	/* Not tested */
	BAD,	/* Known to not work */
	DEP,	/* Support depends on configuration (e.g. Intel flash descriptor) */
	NA,	/* Not applicable (e.g. write support on ROM chips) */
};

The second new state 'NA' is introduced, among other things, to indicate
the erase and write states of real ROMs correctly. This is also implemented
by this patch and required to exchange the previous bit mask in struct
flashchip with a new struct containing an enum test_state for each operation.
The -L output is changed accordingly to print '-' in the case of an N/A state
and the wiki output uses a new template producing a greyed out cell.
Previous users of enum test_state are not affected by this change (yet).

Corresponding to flashrom svn r1798.

Signed-off-by: Stefan Tauner <stefan.tauner@alumni.tuwien.ac.at>
Acked-by: Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>

1 files changed, 32 insertions, 12 deletions

diff --git a/print_wiki.c b/print_wiki.c
index 5dcc4b6dc..cad6fef44 100644
--- a/print_wiki.c
+++ b/print_wiki.c
@@ -249,7 +249,6 @@ static void print_supported_boards_wiki(void)
 static void print_supported_chips_wiki(int cols)
 {
 	unsigned int lines_per_col;
-	uint32_t t;
 	char *s;
 	char vmax[6];
 	char vmin[6];
@@ -287,7 +286,35 @@ static void print_supported_chips_wiki(int cols)
 			c = !c;
 
 		old = f;
-		t = f->tested;
+		const char *probe, *read, *write, *erase;
+		switch (f->tested.probe) {
+			case OK: probe = "OK"; break;
+			case BAD: probe = "No"; break;
+			case NA: probe = "NA"; break;
+			case DEP: probe = "Dep"; break;
+			default: probe = "?3"; break;
+		}
+		switch (f->tested.read) {
+			case OK: read = "OK"; break;
+			case BAD: read = "No"; break;
+			case NA: read = "NA"; break;
+			case DEP: read = "Dep"; break;
+			default: read = "?3"; break;
+		}
+		switch (f->tested.erase) {
+			case OK: erase = "OK"; break;
+			case BAD: erase = "No"; break;
+			case NA: erase = "NA"; break;
+			case DEP: erase = "Dep"; break;
+			default: erase = "?3"; break;
+		}
+		switch (f->tested.write) {
+			case OK: write = "OK"; break;
+			case BAD: write = "No"; break;
+			case NA: write = "NA"; break;
+			case DEP: write = "Dep"; break;
+			default: write = "?3"; break;
+		}
 		s = flashbuses_to_text(f->bustype);
 		sprintf(vmin, "%0.03f", f->voltage.min / (double)1000);
 		sprintf(vmax, "%0.03f", f->voltage.max / (double)1000);
@@ -298,16 +325,9 @@ static void print_supported_chips_wiki(int cols)
 		       "|| %s || %s \n",
 		       (c == 1) ? "eeeeee" : "dddddd", f->vendor, f->name,
 		       f->total_size, s,
-		       (t & TEST_OK_PROBE) ? "OK" :
-		       (t & TEST_BAD_PROBE) ? "No" : "?3",
-		       (t & TEST_OK_READ) ? "OK" :
-		       (t & TEST_BAD_READ) ? "No" : "?3",
-		       (t & TEST_OK_ERASE) ? "OK" :
-		       (t & TEST_BAD_ERASE) ? "No" : "?3",
-		       (t & TEST_OK_WRITE) ? "OK" :
-		       (t & TEST_BAD_WRITE) ? "No" : "?3",
-		       f->voltage.min ? vmin : "N/A",
-		       f->voltage.min ? vmax : "N/A");
+		       probe, read, erase, write,
+		       f->voltage.min ? vmin : "?",
+		       f->voltage.max ? vmax : "?");
 		free(s);
 
 		if (((i % lines_per_col) + 1) == lines_per_col)