tools/testing/nvdimm: unit test for acpi_nvdimm_notify()

Trigger an nmemX/nfit/flags attribute to fire an event whenever a
smart-threshold DSM is received.

Reviewed-by: Vishal Verma <vishal.l.verma@intel.com>
Acked-by: Rafael J. Wysocki <rafael@kernel.org>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>

1 files changed, 45 insertions, 0 deletions

diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index 8d79c75d3cae..99ea68674f0a 100644
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -161,6 +161,7 @@ struct nfit_test {
 		unsigned long deadline;
 		spinlock_t lock;
 	} ars_state;
+	struct device *dimm_dev[NUM_DCR];
 };
 
 static struct nfit_test *to_nfit_test(struct device *dev)
@@ -430,6 +431,9 @@ static int nfit_test_ctl(struct nvdimm_bus_descriptor *nd_desc,
 			break;
 		case ND_CMD_SMART_THRESHOLD:
 			rc = nfit_test_cmd_smart_threshold(buf, buf_len);
+			device_lock(&t->pdev.dev);
+			__acpi_nvdimm_notify(t->dimm_dev[i], 0x81);
+			device_unlock(&t->pdev.dev);
 			break;
 		default:
 			return -ENOTTY;
@@ -566,6 +570,18 @@ static int ars_state_init(struct device *dev, struct ars_state *ars_state)
 	return 0;
 }
 
+static void put_dimms(void *data)
+{
+	struct device **dimm_dev = data;
+	int i;
+
+	for (i = 0; i < NUM_DCR; i++)
+		if (dimm_dev[i])
+			device_unregister(dimm_dev[i]);
+}
+
+static struct class *nfit_test_dimm;
+
 static int nfit_test0_alloc(struct nfit_test *t)
 {
 	size_t nfit_size = sizeof(struct acpi_nfit_system_address) * NUM_SPA
@@ -621,6 +637,15 @@ static int nfit_test0_alloc(struct nfit_test *t)
 	if (!t->_fit)
 		return -ENOMEM;
 
+	if (devm_add_action_or_reset(&t->pdev.dev, put_dimms, t->dimm_dev))
+		return -ENOMEM;
+	for (i = 0; i < NUM_DCR; i++) {
+		t->dimm_dev[i] = device_create(nfit_test_dimm, &t->pdev.dev, 0,
+				NULL, "test_dimm%d", i);
+		if (!t->dimm_dev[i])
+			return -ENOMEM;
+	}
+
 	return ars_state_init(&t->pdev.dev, &t->ars_state);
 }
 
@@ -1414,6 +1439,7 @@ static int nfit_test_probe(struct platform_device *pdev)
 	struct acpi_nfit_desc *acpi_desc;
 	struct device *dev = &pdev->dev;
 	struct nfit_test *nfit_test;
+	struct nfit_mem *nfit_mem;
 	union acpi_object *obj;
 	int rc;
 
@@ -1493,6 +1519,20 @@ static int nfit_test_probe(struct platform_device *pdev)
 	obj->buffer.pointer = nfit_test->nfit_buf;
 	*(nfit_test->_fit) = obj;
 	__acpi_nfit_notify(&pdev->dev, nfit_test, 0x80);
+
+	/* associate dimm devices with nfit_mem data for notification testing */
+	mutex_lock(&acpi_desc->init_mutex);
+	list_for_each_entry(nfit_mem, &acpi_desc->dimms, list) {
+		u32 nfit_handle = __to_nfit_memdev(nfit_mem)->device_handle;
+		int i;
+
+		for (i = 0; i < NUM_DCR; i++)
+			if (nfit_handle == handle[i])
+				dev_set_drvdata(nfit_test->dimm_dev[i],
+						nfit_mem);
+	}
+	mutex_unlock(&acpi_desc->init_mutex);
+
 	return 0;
 }
 
@@ -1526,6 +1566,10 @@ static __init int nfit_test_init(void)
 {
 	int rc, i;
 
+	nfit_test_dimm = class_create(THIS_MODULE, "nfit_test_dimm");
+	if (IS_ERR(nfit_test_dimm))
+		return PTR_ERR(nfit_test_dimm);
+
 	nfit_test_setup(nfit_test_lookup);
 
 	for (i = 0; i < NUM_NFITS; i++) {
@@ -1592,6 +1636,7 @@ static __exit void nfit_test_exit(void)
 	for (i = 0; i < NUM_NFITS; i++)
 		platform_device_unregister(&instances[i]->pdev);
 	nfit_test_teardown();
+	class_destroy(nfit_test_dimm);
 }
 
 module_init(nfit_test_init);