linux.git - Linux kernel mainline tree

	Commit message (Collapse)	Author	Age	Files	Lines
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*	[MTD] [TESTS] Fix some size_t printk format warnings	David Woodhouse	2009-01-05	2	-4/+4
\| \| \| \|	Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
*	MTD: add MTD tests to compilation	Artem Bityutskiy	2008-12-10	1	-0/+7
\| \| \| \| \| \|	Add MTD tests to Kconfig and Makefiles. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
*	MTD: tests: add mtd_torturetest	Artem Bityutskiy	2008-12-10	1	-0/+530
\| \| \| \| \| \| \|	This test is designed to work for very long time and it tries to wear few eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
*	MTD: tests: add mtd_subpagetest	Artem Bityutskiy	2008-12-08	1	-0/+525
\| \| \| \| \| \|	This tests makes sure sub-pages on NAND MTD device work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
*	MTD: tests: add mtd_stresstest	Artem Bityutskiy	2008-12-08	1	-0/+330
\| \| \| \| \| \|	This test just performs random operations on random eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
*	MTD: tests: add mtd_speedtest	Artem Bityutskiy	2008-12-08	1	-0/+502
\| \| \| \| \| \|	This test examines I/O speed of the flash device. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
*	MTD: tests: add mtd_readtest	Artem Bityutskiy	2008-12-08	1	-0/+253
\| \| \| \| \| \|	A simple tests which reads whole MTD device one page at a time. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
*	MTD: tests: add mtd_pagetest	Artem Bityutskiy	2008-12-08	1	-0/+632
\| \| \| \| \| \|	This test checks that NAND pages read/write work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
*	MTD: tests: add mtd_oobtest	Artem Bityutskiy	2008-12-08	1	-0/+742
	This test checks that OOB of a NAND MTD device works fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>