opaque_master: Mark Opaque chip as tested for WP

Opaque masters, by design, populate the flashchip structure during
the execution of their probe function. Therefore any opaque master
operation displays a message to the user:
"This flash part has status UNTESTED for operations: WP".

However, for all the other operations (read, write, erase) opaque
masters always mark them as tested. Thus, align WP as marked tested
inline with other opaque chip operations.

BUG=b:258755442
TEST=the following does not display untested message:
1) flashrom -p dummy:size=8388608,emulate=VARIABLE_SIZE
2) flashrom -p internal (on Intel device)

Change-Id: I5ae4cb49eb0abc6ab26cfe2f3359e4e50dd4fd4f
Signed-off-by: Anastasia Klimchuk <aklm@chromium.org>
Reviewed-on: https://review.coreboot.org/c/flashrom/+/69842
Tested-by: build bot (Jenkins) <no-reply@coreboot.org>
Reviewed-by: Edward O'Callaghan <quasisec@chromium.org>
Reviewed-by: Sergii Dmytruk <sergii.dmytruk@3mdeb.com>
Reviewed-by: Felix Singer <felixsinger@posteo.net>

1 files changed, 1 insertions, 1 deletions

diff --git a/ichspi.c b/ichspi.c
index 4e982f08c..cd330e3ba 100644
--- a/ichspi.c
+++ b/ichspi.c
@@ -1485,7 +1485,7 @@ static int ich_hwseq_probe(struct flashctx *flash)
 		msg_cdbg("In that range are %d erase blocks with %d B each.\n",
 			 size_high / erase_size_high, erase_size_high);
 	}
-	flash->chip->tested = TEST_OK_PREW;
+	flash->chip->tested = TEST_OK_PREWB;
 	return 1;
 }