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authorDan Williams <dan.j.williams@intel.com>2018-10-17 10:47:19 -0700
committerDan Williams <dan.j.williams@intel.com>2018-10-17 10:47:19 -0700
commitf110176633d74bbac1f80ab9b9c6b83ea3e1cc23 (patch)
treef373f4a5ba3a6aaadbd54735b39fe4668fc27549 /drivers
parent0ead11181fe0c9538b185e46a494df21dc7de23a (diff)
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tools/testing/nvdimm: Populate dirty shutdown data
Allow the unit tests to verify the retrieval of the dirty shutdown count via smart commands, and allow the driver-load-time retrieval of the smart health payload to be simulated by nfit_test. Reviewed-by: Keith Busch <keith.busch@intel.com> Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Diffstat (limited to 'drivers')
-rw-r--r--drivers/acpi/nfit/core.c7
1 files changed, 5 insertions, 2 deletions
diff --git a/drivers/acpi/nfit/core.c b/drivers/acpi/nfit/core.c
index bf7021bb276c..ec8fb578fa36 100644
--- a/drivers/acpi/nfit/core.c
+++ b/drivers/acpi/nfit/core.c
@@ -1721,7 +1721,7 @@ static bool acpi_nvdimm_has_method(struct acpi_device *adev, char *method)
return false;
}
-static void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
+__weak void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
{
struct nd_intel_smart smart = { 0 };
union acpi_object in_buf = {
@@ -1785,8 +1785,11 @@ static int acpi_nfit_add_dimm(struct acpi_nfit_desc *acpi_desc,
nfit_mem->dsm_mask = acpi_desc->dimm_cmd_force_en;
nfit_mem->family = NVDIMM_FAMILY_INTEL;
adev = to_acpi_dev(acpi_desc);
- if (!adev)
+ if (!adev) {
+ /* unit test case */
+ populate_shutdown_status(nfit_mem);
return 0;
+ }
adev_dimm = acpi_find_child_device(adev, device_handle, false);
nfit_mem->adev = adev_dimm;