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| author | Dan Williams <dan.j.williams@intel.com> | 2018-04-09 16:38:01 -0700 |
|---|---|---|
| committer | Dan Williams <dan.j.williams@intel.com> | 2018-04-16 08:18:51 -0700 |
| commit | 718fda67d2f69cc6074b4b6a740a6e4aacd44eff (patch) | |
| tree | ec82661354af990009bcf688c528624d527e7eef /tools/testing/nvdimm | |
| parent | 55c72ab62e47fc584131901baddb2752e949ebcd (diff) | |
| download | linux-stable-718fda67d2f69cc6074b4b6a740a6e4aacd44eff.tar.gz linux-stable-718fda67d2f69cc6074b4b6a740a6e4aacd44eff.tar.bz2 linux-stable-718fda67d2f69cc6074b4b6a740a6e4aacd44eff.zip | |
tools/testing/nvdimm: support nfit_test_dimm attributes under nfit_test.1
The nfit_test.1 bus provides a pmem topology without blk-aperture
enabling, so it presents different failure modes for label space
handling. Allow custom DSM command error injection.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Diffstat (limited to 'tools/testing/nvdimm')
| -rw-r--r-- | tools/testing/nvdimm/test/nfit.c | 43 |
1 files changed, 25 insertions, 18 deletions
diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c index dc6cf5630280..c8c88363311b 100644 --- a/tools/testing/nvdimm/test/nfit.c +++ b/tools/testing/nvdimm/test/nfit.c @@ -1166,12 +1166,12 @@ static int ars_state_init(struct device *dev, struct ars_state *ars_state) static void put_dimms(void *data) { - struct device **dimm_dev = data; + struct nfit_test *t = data; int i; - for (i = 0; i < NUM_DCR; i++) - if (dimm_dev[i]) - device_unregister(dimm_dev[i]); + for (i = 0; i < t->num_dcr; i++) + if (t->dimm_dev[i]) + device_unregister(t->dimm_dev[i]); } static struct class *nfit_test_dimm; @@ -1180,13 +1180,11 @@ static int dimm_name_to_id(struct device *dev) { int dimm; - if (sscanf(dev_name(dev), "test_dimm%d", &dimm) != 1 - || dimm >= NUM_DCR || dimm < 0) + if (sscanf(dev_name(dev), "test_dimm%d", &dimm) != 1) return -ENXIO; return dimm; } - static ssize_t handle_show(struct device *dev, struct device_attribute *attr, char *buf) { @@ -1259,7 +1257,6 @@ static ssize_t fail_cmd_code_store(struct device *dev, struct device_attribute * } static DEVICE_ATTR_RW(fail_cmd_code); - static struct attribute *nfit_test_dimm_attributes[] = { &dev_attr_fail_cmd.attr, &dev_attr_fail_cmd_code.attr, @@ -1276,6 +1273,23 @@ static const struct attribute_group *nfit_test_dimm_attribute_groups[] = { NULL, }; +static int nfit_test_dimm_init(struct nfit_test *t) +{ + int i; + + if (devm_add_action_or_reset(&t->pdev.dev, put_dimms, t)) + return -ENOMEM; + for (i = 0; i < t->num_dcr; i++) { + t->dimm_dev[i] = device_create_with_groups(nfit_test_dimm, + &t->pdev.dev, 0, NULL, + nfit_test_dimm_attribute_groups, + "test_dimm%d", i + t->dcr_idx); + if (!t->dimm_dev[i]) + return -ENOMEM; + } + return 0; +} + static void smart_init(struct nfit_test *t) { int i; @@ -1371,17 +1385,8 @@ static int nfit_test0_alloc(struct nfit_test *t) if (!t->_fit) return -ENOMEM; - if (devm_add_action_or_reset(&t->pdev.dev, put_dimms, t->dimm_dev)) + if (nfit_test_dimm_init(t)) return -ENOMEM; - for (i = 0; i < NUM_DCR; i++) { - t->dimm_dev[i] = device_create_with_groups(nfit_test_dimm, - &t->pdev.dev, 0, NULL, - nfit_test_dimm_attribute_groups, - "test_dimm%d", i); - if (!t->dimm_dev[i]) - return -ENOMEM; - } - smart_init(t); return ars_state_init(&t->pdev.dev, &t->ars_state); } @@ -1413,6 +1418,8 @@ static int nfit_test1_alloc(struct nfit_test *t) if (!t->spa_set[1]) return -ENOMEM; + if (nfit_test_dimm_init(t)) + return -ENOMEM; smart_init(t); return ars_state_init(&t->pdev.dev, &t->ars_state); } |