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authorMasayoshi Mizuma <m.mizuma@jp.fujitsu.com>2018-10-30 21:50:25 -0400
committerDan Williams <dan.j.williams@intel.com>2018-11-05 11:34:08 -0800
commitaf31b04b67f4fd7f639fd465a507c154c46fc9fb (patch)
tree8e5d243cca7c1ea46bab279cd0fad2120174bb1c /tools
parent651022382c7f8da46cb4872a545ee1da6d097d2a (diff)
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tools/testing/nvdimm: Fix the array size for dimm devices.
KASAN reports following global out of bounds access while nfit_test is being loaded. The out of bound access happens the following reference to dimm_fail_cmd_flags[dimm]. 'dimm' is over than the index value, NUM_DCR (==5). static int override_return_code(int dimm, unsigned int func, int rc) { if ((1 << func) & dimm_fail_cmd_flags[dimm]) { dimm_fail_cmd_flags[] definition: static unsigned long dimm_fail_cmd_flags[NUM_DCR]; 'dimm' is the return value of get_dimm(), and get_dimm() returns the index of handle[] array. The handle[] has 7 index. Let's use ARRAY_SIZE(handle) as the array size. KASAN report: ================================================================== BUG: KASAN: global-out-of-bounds in nfit_test_ctl+0x47bb/0x55b0 [nfit_test] Read of size 8 at addr ffffffffc10cbbe8 by task kworker/u41:0/8 ... Call Trace: dump_stack+0xea/0x1b0 ? dump_stack_print_info.cold.0+0x1b/0x1b ? kmsg_dump_rewind_nolock+0xd9/0xd9 print_address_description+0x65/0x22e ? nfit_test_ctl+0x47bb/0x55b0 [nfit_test] kasan_report.cold.6+0x92/0x1a6 nfit_test_ctl+0x47bb/0x55b0 [nfit_test] ... The buggy address belongs to the variable: dimm_fail_cmd_flags+0x28/0xffffffffffffa440 [nfit_test] ================================================================== Fixes: 39611e83a28c ("tools/testing/nvdimm: Make DSM failure code injection...") Signed-off-by: Masayoshi Mizuma <m.mizuma@jp.fujitsu.com> Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Diffstat (limited to 'tools')
-rw-r--r--tools/testing/nvdimm/test/nfit.c8
1 files changed, 4 insertions, 4 deletions
diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index 9527d47a1070..01ec04bf91b5 100644
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -140,8 +140,8 @@ static u32 handle[] = {
[6] = NFIT_DIMM_HANDLE(1, 0, 0, 0, 1),
};
-static unsigned long dimm_fail_cmd_flags[NUM_DCR];
-static int dimm_fail_cmd_code[NUM_DCR];
+static unsigned long dimm_fail_cmd_flags[ARRAY_SIZE(handle)];
+static int dimm_fail_cmd_code[ARRAY_SIZE(handle)];
static const struct nd_intel_smart smart_def = {
.flags = ND_INTEL_SMART_HEALTH_VALID
@@ -205,7 +205,7 @@ struct nfit_test {
unsigned long deadline;
spinlock_t lock;
} ars_state;
- struct device *dimm_dev[NUM_DCR];
+ struct device *dimm_dev[ARRAY_SIZE(handle)];
struct nd_intel_smart *smart;
struct nd_intel_smart_threshold *smart_threshold;
struct badrange badrange;
@@ -2680,7 +2680,7 @@ static int nfit_test_probe(struct platform_device *pdev)
u32 nfit_handle = __to_nfit_memdev(nfit_mem)->device_handle;
int i;
- for (i = 0; i < NUM_DCR; i++)
+ for (i = 0; i < ARRAY_SIZE(handle); i++)
if (nfit_handle == handle[i])
dev_set_drvdata(nfit_test->dimm_dev[i],
nfit_mem);