diff options
| -rw-r--r-- | Documentation/ABI/testing/sysfs-class-mtd | 12 | ||||
| -rw-r--r-- | drivers/mtd/mtdcore.c | 10 |
2 files changed, 22 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd index 4d55a1888981..43d18180b46e 100644 --- a/Documentation/ABI/testing/sysfs-class-mtd +++ b/Documentation/ABI/testing/sysfs-class-mtd @@ -123,3 +123,15 @@ Description: half page, or a quarter page). In the case of ECC NOR, it is the ECC block size. + +What: /sys/class/mtd/mtdX/ecc_strength +Date: April 2012 +KernelVersion: 3.4 +Contact: linux-mtd@lists.infradead.org +Description: + Maximum number of bit errors that the device is capable of + correcting within each region covering an ecc step. This will + always be a non-negative integer. Note that some devices will + have multiple ecc steps within each writesize region. + + In the case of devices lacking any ECC capability, it is 0. diff --git a/drivers/mtd/mtdcore.c b/drivers/mtd/mtdcore.c index c837507dfb1c..090e849d3dcd 100644 --- a/drivers/mtd/mtdcore.c +++ b/drivers/mtd/mtdcore.c @@ -250,6 +250,15 @@ static ssize_t mtd_name_show(struct device *dev, } static DEVICE_ATTR(name, S_IRUGO, mtd_name_show, NULL); +static ssize_t mtd_ecc_strength_show(struct device *dev, + struct device_attribute *attr, char *buf) +{ + struct mtd_info *mtd = dev_get_drvdata(dev); + + return snprintf(buf, PAGE_SIZE, "%u\n", mtd->ecc_strength); +} +static DEVICE_ATTR(ecc_strength, S_IRUGO, mtd_ecc_strength_show, NULL); + static struct attribute *mtd_attrs[] = { &dev_attr_type.attr, &dev_attr_flags.attr, @@ -260,6 +269,7 @@ static struct attribute *mtd_attrs[] = { &dev_attr_oobsize.attr, &dev_attr_numeraseregions.attr, &dev_attr_name.attr, + &dev_attr_ecc_strength.attr, NULL, }; |