diff options
| author | Wenyi Xie <xiewenyi2@huawei.com> | 2021-08-11 14:35:39 +0800 |
|---|---|---|
| committer | mergify[bot] <37929162+mergify[bot]@users.noreply.github.com> | 2021-08-12 08:34:04 +0000 |
| commit | ac826886c98524e918753419c039d8b44198943f (patch) | |
| tree | 0b8d45a1319d19ce046c8d3a55db72f26a1bbcbb /MdeModulePkg/Library/UefiSortLib | |
| parent | a776bbabd9e8f370feb089cdc016324b1d6a37c7 (diff) | |
| download | edk2-ac826886c98524e918753419c039d8b44198943f.tar.gz edk2-ac826886c98524e918753419c039d8b44198943f.tar.bz2 edk2-ac826886c98524e918753419c039d8b44198943f.zip | |
MdeModulePkg/UefiSortLib:Add UefiSortLib unit test
Adding two unit test case for UefiSortLib. One is a test on
sorting an array of UINT32 by using PerformQuickSort, another
is a test on comparing the same buffer by using StringCompare.
Add 'main' function name to ECC exception list to avoid ECC
error.
Cc: Jian J Wang <jian.j.wang@intel.com>
Cc: Hao A Wu <hao.a.wu@intel.com>
Signed-off-by: Wenyi Xie <xiewenyi2@huawei.com>
Reviewed-by: Hao A Wu <hao.a.wu@intel.com>
Diffstat (limited to 'MdeModulePkg/Library/UefiSortLib')
| -rw-r--r-- | MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c | 207 | ||||
| -rw-r--r-- | MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf | 32 |
2 files changed, 239 insertions, 0 deletions
diff --git a/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c new file mode 100644 index 0000000000..4f44a02c5b --- /dev/null +++ b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c @@ -0,0 +1,207 @@ +/** @file
+ Unit tests of the UefiSortLib
+
+ Copyright (C) Huawei Technologies Co., Ltd. All rights reserved
+ SPDX-License-Identifier: BSD-2-Clause-Patent
+
+**/
+
+#include <stdio.h>
+#include <string.h>
+#include <stdarg.h>
+#include <stddef.h>
+#include <setjmp.h>
+#include <cmocka.h>
+
+#include <Uefi.h>
+#include <Library/BaseLib.h>
+#include <Library/DebugLib.h>
+#include <Library/MemoryAllocationLib.h>
+
+#include <Library/UnitTestLib.h>
+#include <Library/SortLib.h>
+
+#define UNIT_TEST_APP_NAME "UefiSortLib Unit Tests"
+#define UNIT_TEST_APP_VERSION "1.0"
+
+#define TEST_ARRAY_SIZE_9 9
+
+/**
+ The function is called by PerformQuickSort to compare int values.
+
+ @param[in] Left The pointer to first buffer.
+ @param[in] Right The pointer to second buffer.
+
+ @retval 0 Buffer1 equal to Buffer2.
+ @return <0 Buffer1 is less than Buffer2.
+ @return >0 Buffer1 is greater than Buffer2.
+
+**/
+INTN
+EFIAPI
+TestCompareFunction (
+ IN CONST VOID *Left,
+ IN CONST VOID *Right
+ )
+{
+ if (*(UINT32*)Right > *(UINT32*)Left) {
+ return 1;
+ } else if (*(UINT32*)Right < *(UINT32*)Left) {
+ return -1;
+ }
+
+ return 0;
+}
+
+/**
+ Unit test for PerformQuickSort () API of the UefiSortLib.
+
+ @param[in] Context [Optional] An optional parameter that enables:
+ 1) test-case reuse with varied parameters and
+ 2) test-case re-entry for Target tests that need a
+ reboot. This parameter is a VOID* and it is the
+ responsibility of the test author to ensure that the
+ contents are well understood by all test cases that may
+ consume it.
+
+ @retval UNIT_TEST_PASSED The Unit test has completed and the test
+ case was successful.
+ @retval UNIT_TEST_ERROR_TEST_FAILED A test case assertion has failed.
+**/
+UNIT_TEST_STATUS
+EFIAPI
+SortUINT32ArrayShouldSucceed (
+ IN UNIT_TEST_CONTEXT Context
+ )
+{
+ UINTN TestCount;
+ UINT32 Index;
+ UINT32 TestBuffer[TEST_ARRAY_SIZE_9];
+ UINT32 TestResult[TEST_ARRAY_SIZE_9];
+
+ TestCount = TEST_ARRAY_SIZE_9;
+ for (Index = 0; Index < TEST_ARRAY_SIZE_9; Index++) {
+ TestBuffer[Index] = Index + 1;
+ TestResult[Index] = TEST_ARRAY_SIZE_9 - Index;
+ }
+
+ PerformQuickSort (TestBuffer, TestCount, sizeof (UINT32), (SORT_COMPARE)TestCompareFunction);
+ UT_ASSERT_MEM_EQUAL (TestBuffer, TestResult, sizeof (UINT32) * TEST_ARRAY_SIZE_9);
+
+ return UNIT_TEST_PASSED;
+}
+
+/**
+ Unit test for StringCompare () API of the UefiSortLib.
+
+ @param[in] Context [Optional] An optional parameter that enables:
+ 1) test-case reuse with varied parameters and
+ 2) test-case re-entry for Target tests that need a
+ reboot. This parameter is a VOID* and it is the
+ responsibility of the test author to ensure that the
+ contents are well understood by all test cases that may
+ consume it.
+
+ @retval UNIT_TEST_PASSED The Unit test has completed and the test
+ case was successful.
+ @retval UNIT_TEST_ERROR_TEST_FAILED A test case assertion has failed.
+**/
+UNIT_TEST_STATUS
+EFIAPI
+CompareSameBufferShouldSucceed (
+ IN UNIT_TEST_CONTEXT Context
+ )
+{
+ INTN retval;
+ CONST CHAR16* TestBuffer[] = { L"abcdefg" };
+
+ retval = StringCompare (TestBuffer, TestBuffer);
+ UT_ASSERT_TRUE (retval == 0);
+
+ return UNIT_TEST_PASSED;
+}
+
+/**
+ Initialze the unit test framework, suite, and unit tests for the
+ UefiSortLib and run the UefiSortLib unit test.
+
+ @retval EFI_SUCCESS All test cases were dispatched.
+ @retval EFI_OUT_OF_RESOURCES There are not enough resources available to
+ initialize the unit tests.
+**/
+STATIC
+EFI_STATUS
+EFIAPI
+UnitTestingEntry (
+ VOID
+ )
+{
+ EFI_STATUS Status;
+ UNIT_TEST_FRAMEWORK_HANDLE Framework;
+ UNIT_TEST_SUITE_HANDLE SortTests;
+
+ Framework = NULL;
+
+ DEBUG(( DEBUG_INFO, "%a v%a\n", UNIT_TEST_APP_NAME, UNIT_TEST_APP_VERSION ));
+
+ //
+ // Start setting up the test framework for running the tests.
+ //
+ Status = InitUnitTestFramework (&Framework, UNIT_TEST_APP_NAME, gEfiCallerBaseName, UNIT_TEST_APP_VERSION);
+ if (EFI_ERROR (Status)) {
+ DEBUG ((DEBUG_ERROR, "Failed in InitUnitTestFramework. Status = %r\n", Status));
+ goto EXIT;
+ }
+
+ //
+ // Populate the UefiSortLib Unit Test Suite.
+ //
+ Status = CreateUnitTestSuite (&SortTests, Framework, "UefiSortLib Sort Tests", "UefiSortLib.SortLib", NULL, NULL);
+ if (EFI_ERROR (Status)) {
+ DEBUG ((DEBUG_ERROR, "Failed in CreateUnitTestSuite for UefiSortLib API Tests\n"));
+ Status = EFI_OUT_OF_RESOURCES;
+ goto EXIT;
+ }
+
+ //
+ // --------------Suite--------Description------------Name--------------Function----------------Pre---Post---Context-----------
+ //
+ AddTestCase (SortTests, "Sort the Array", "Sort", SortUINT32ArrayShouldSucceed, NULL, NULL, NULL);
+ AddTestCase (SortTests, "Compare the Buffer", "Compare", CompareSameBufferShouldSucceed, NULL, NULL, NULL);
+
+ //
+ // Execute the tests.
+ //
+ Status = RunAllTestSuites (Framework);
+
+EXIT:
+ if (Framework) {
+ FreeUnitTestFramework (Framework);
+ }
+
+ return Status;
+}
+
+///
+/// Avoid ECC error for function name that starts with lower case letter
+///
+#define UefiSortLibUnitTestMain main
+
+/**
+ Standard POSIX C entry point for host based unit test execution.
+
+ @param[in] Argc Number of arguments
+ @param[in] Argv Array of pointers to arguments
+
+ @retval 0 Success
+ @retval other Error
+**/
+INT32
+UefiSortLibUnitTestMain (
+ IN INT32 Argc,
+ IN CHAR8 *Argv[]
+ )
+{
+ UnitTestingEntry ();
+ return 0;
+}
diff --git a/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf new file mode 100644 index 0000000000..85d8dcd696 --- /dev/null +++ b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf @@ -0,0 +1,32 @@ +## @file
+# This is a unit test for the UefiSortLib.
+#
+# Copyright (C) Huawei Technologies Co., Ltd. All rights reserved
+# SPDX-License-Identifier: BSD-2-Clause-Patent
+##
+
+[Defines]
+ INF_VERSION = 0x00010017
+ BASE_NAME = UefiSortLibUnitTest
+ FILE_GUID = 271337A3-0D79-BA3E-BC03-714E518E3B1B
+ VERSION_STRING = 1.0
+ MODULE_TYPE = HOST_APPLICATION
+
+#
+# The following information is for reference only and not required by the build tools.
+#
+# VALID_ARCHITECTURES = IA32 X64
+#
+
+[Sources]
+ UefiSortLibUnitTest.c
+
+[Packages]
+ MdePkg/MdePkg.dec
+ MdeModulePkg/MdeModulePkg.dec
+ UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec
+
+[LibraryClasses]
+ UnitTestLib
+ DebugLib
+ UefiSortLib
|