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authorChiYuan Huang <cy_huang@richtek.com>2022-07-19 22:52:45 +0800
committerJonathan Cameron <Jonathan.Cameron@huawei.com>2022-08-15 22:29:57 +0100
commit7898f31b0e7a6ba1ec9c7391e7ece9e31dd93262 (patch)
tree63357416940782e99530e43ff8b5b78eb753bcbb /Documentation/ABI
parent4396f45d211b6aa2f3a821f0a3a77c992335724b (diff)
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Documentation: ABI: testing: rtq6056: Update ABI docs
Add documentation for the usage of voltage channel integration time. Signed-off-by: ChiYuan Huang <cy_huang@richtek.com> Link: https://lore.kernel.org/r/1658242365-27797-4-git-send-email-u0084500@gmail.com Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Diffstat (limited to 'Documentation/ABI')
-rw-r--r--Documentation/ABI/testing/sysfs-bus-iio11
1 files changed, 11 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index e81ba6f5e1c8..7faec5b3a553 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -2038,3 +2038,14 @@ Description:
Available range for the forced calibration value, expressed as:
- a range specified as "[min step max]"
+
+What: /sys/bus/iio/devices/iio:deviceX/in_voltageX_sampling_frequency
+What: /sys/bus/iio/devices/iio:deviceX/in_powerY_sampling_frequency
+What: /sys/bus/iio/devices/iio:deviceX/in_currentZ_sampling_frequency
+KernelVersion: 5.20
+Contact: linux-iio@vger.kernel.org
+Description:
+ Some devices have separate controls of sampling frequency for
+ individual channels. If multiple channels are enabled in a scan,
+ then the sampling_frequency of the scan may be computed from the
+ per channel sampling frequencies.