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authorAkinobu Mita <akinobu.mita@gmail.com>2018-01-03 13:22:47 -0500
committerMauro Carvalho Chehab <mchehab@s-opensource.com>2018-01-05 12:51:36 -0500
commit74e08739c0f7400cf2c0e1ddf4c52e24aad1768a (patch)
treeaf6a55ce9e83fc70107b27fd2847e491e1405dd2 /drivers/media/i2c/sr030pc30.c
parent6705d55cfe148ee4fa37ded3417a76f2ae533b2e (diff)
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media: mt9m111: add V4L2_CID_TEST_PATTERN control
The mt9m111 has the test pattern generator features. This makes use of it through V4L2_CID_TEST_PATTERN control. Cc: Mauro Carvalho Chehab <mchehab@s-opensource.com> Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com> Signed-off-by: Mauro Carvalho Chehab <mchehab@s-opensource.com>
Diffstat (limited to 'drivers/media/i2c/sr030pc30.c')
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